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All Products / Test Targets | 測試板 / Image Analysis & Stage Micrometers | 圖像分析和平臺測試板
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雙軸線性尺規鏡臺測微尺

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  • 雙軸設計
  • 英制和公制型號
  • 備有NIST認證的型號

本線性尺規鏡臺測微尺可同時在X軸和Y軸精確校準機器視覺系統。校準時無需旋轉，也無需補償相機寬高比。本品有兩組刻線，公制刻線（25μm一小格）和英制刻線（1 mil (0.001")一小格）。Target is chrome on glass or chrome on opal.

 
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