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漫反射柵格畸變測試板

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  • 漫反射處理模仿陶瓷測試板
  • 基片上鍍鉻膜
  • 軸上照明或軸外照明皆無眩光
  • 非常適合前置照明測量

本漫反射柵格畸變測試板的漫反射處理與陶瓷測試板相似,可將光線進行漫反射處理,防止成像面出現眩光。使用本測試板可輕鬆確定圖像中存在的精確畸變大小。可採用測量軟體中的Blob分析來計算圓點中心,並根據標準來計算,以從圖像中移除畸變。本測試板提供2種基片尺寸和3種圓點頻率,可與從廣角鏡頭到遠攝鏡頭的多種鏡頭配合使用。

一般規格

NIST Certification:
No
Thickness (mm):
2.00 ±0.2
Center to Center Spacing Tolerance (μm):
± 1
Dot Diameter Tolerance (μm):
±3
Coating:
Low Reflective Chrome
Substrate:
Float Glass

產品

 Title   比較   庫存號碼   價格  Buy
2" x 2" 0.0625mm Dot, Low Reflect Grid Distortion Target
2" x 2" 0.125mm Dot, Low Reflect Grid Distortion Target
2" x 2" 0.25mm Dot, Low Reflect Grid Distortion Target
3" x 3" 0.125mm Dot, Low Reflect Grid Distortion Target
3" x 3" 0.25mm Dot, Low Reflect Grid Distortion Target
3" x 3" 0.5mm Dot, Low Reflect Grid Distortion Target
 
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