DataRay M² Measurement Systems

DataRay M² Measurement Systems combine a beam profiling camera mounted on an automated translation stage to make an all-in-one M² measurement system. M², or Beam Quality Factor, characterizes the degree of imperfection in a real-world laser beam relative to a perfect TEM00 beam, and is a common acceptance criterion for laser or laser system manufacturing. These systems operate by moving the mounted beam profiler through the beam waist to perform ISO 11146 compliant measurements and are available with 50 or 200mm travel lengths, and two wavelength range options of 355 - 1150nm or 2000 - 16000nm. DataRay M² Measurement Systems are designed with an easy-to-setup USB3 system, intuitive software interface, and have a variety of accessories available separately. These measurements systems are ideal for measuring a wide range of M² on pulsed and CW lasers.