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鏤空式光路USAF測試板

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  • 確定X光、紫外、熱及遠紅外成像系統的分辨率
  • 輕鬆固定
  • 非常適用於穿透應用

我們的鏤空式光路USAF測試板採用極薄的電鑄鎳基底製造。由於圖案區域沒有玻璃,光線僅通過空氣,因此消除了著色與吸收問題。測試板圖案包含群組0元素1到群組3元素6。我們的紫外熔融矽石與螢光USAF測試板可用於多數NUV應用,但鏤空式光路測試板可用於非常深的紫外與遠紅外應用。The electroform pattern is mounted between two circular plates, allowing it to be mounted in our standard optic mount, #64-565.

技術資訊

Number of Line Pairs / mm in USAF Resolving Power Test Target 1951
Element
Group No.
0 1 2 3
1 1.00 2.00 4.00 8.00
2 1.12 2.24 4.49 8.98
3 1.26 2.52 5.04 10.10
4 1.41 2.83 5.66 11.30
5 1.59 3.17 6.35 12.70
6 1.78 3.56 7.13 14.30
 
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