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Laser Microscopy | 雷射顯微鏡

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reflx™ 物鏡 reflx™ 物鏡
TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. TECHSPEC®組件由愛特蒙特光學設計、指定或製造。進一步瞭解
  • 領先業界的 19 至 31mm 工作距離
  • 由愛特蒙特光學設計及製造,適用於聚焦或成像應用
  • 主動對準以實現最佳效能
  • 190nm 至 11μm 的超寬光譜帶,無色像差
  • 亦提供 高效能reflx™物鏡
高效能reflx™物鏡 高效能reflx™物鏡
TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. TECHSPEC®組件由愛特蒙特光學設計、指定或製造。進一步瞭解
  • 繞射極限效能:λ/14 RMS 穿透波前
  • 採用錐形設計,在入射角為45°時可取得更大的間隙
  • 採用曲線型十字軸支架,以降低繞射影響
  • 亦提供 reflx™反射物镜 物鏡
mitutoyo NIR, NUV, 及 UV 遠場補正物鏡 mitutoyo NIR, NUV, 及 UV 遠場補正物鏡
Top Seller
  • 非常適用於紫外線、可見光及近紅外光譜範圍的亮場成像
  • 對Nd:YAG雷射光具有出眾的效能
  • 具有廣泛的光譜範圍
三豐(Mitutoyo) 遠場校正長工作距離物鏡 三豐(Mitutoyo) 遠場校正長工作距離物鏡
Top Seller
  • 工作距離長
  • 複消色差光學設計
  • 整個像場平場結構

Laser Optics

Laser Microscopy is used to image samples through the use of focused laser beams. In general Laser Microscopy applications, a sample is scanned by a focused laser beam and the intensity of the reflected beam is converted to a digital image. Confocal microscopy, also known as confocal laser scanning microscopy, offers various advantages over traditional wide-field microscopy, such as enhanced resolution, targeted imaging location, and higher image depth. Common laser microscopy techniques include super-resolution microscopy, fluorescence microscopy, and two- or multi-photon microscopy.

Edmund Optics offers a range of Laser Microscopy objectives in finite and infinite conjugate styles for use with common laser wavelengths, such as those of popular laser diodes or Nd:YAG harmonics. Our TECHSPEC® ReflX™ Objectives are reflective microscope objectives that can efficiently focus laser light without introducing any chromatic aberration. These objectives feature a rugged design to withstand exposure to moderate heat or abrasion and are ideal in applications that range from FTIR spectroscopy to semiconductor inspection. TECHSPEC® High Performance ReflX™ Objectives are also available, providing better peak-to-valley transmitted wavefront and a design that allows for angles of incidence up to 45°. Mitutoyo Objectives, with excellent performance at Nd:YAG harmonics, are ideal for integration into semiconductor inspection or laser cutting applications.

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